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OSU Stillwater
OSU - Electronic Theses and Dissertations
OSU Theses
Excess Noise Spectral Analysis of Boron Implanted Layers in Silicon
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Publication
Excess Noise Spectral Analysis of Boron Implanted Layers in Silicon
Tandon, Jawahar Lal
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Abstract
Date
1973-05-01
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OSU Theses
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Thesis-1973-T163e.pdf
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581.1 KB
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Adobe PDF
URI
http://hdl.handle.net/20.500.14446/23974
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